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Nikon (United States) | Researchclopedia
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Nikon (United States)
Melville, New York
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Advanced Measurement and Metrology Techniques
Advanced optical system design
Optical Coatings and Gratings
Electron and X-Ray Spectroscopy Techniques
Advanced Fluorescence Microscopy Techniques
Nanofabrication and Lithography Techniques
Surface Roughness and Optical Measurements
Industrial Vision Systems and Defect Detection
Optical measurement and interference techniques
Eduard Vieta
University of Copenhagen
2,229 works
102,878 citations
h-index: 153
Adaptive optics: from astronomy to bioimaging
Yunhe Feng
,
Jean Commère
,
et al.
2026
0 citations