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ASM International (Netherlands) | Researchclopedia

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ASM International (Netherlands)

Almere Stadcompany

72

Works

1,514

Citations

20

h-index

Top Research Topics

Semiconductor materials and devices Silicon and Solar Cell Technologies Integrated Circuits and Semiconductor Failure Analysis

Top Researchers

Guodong Qian Zhejiang Sci-Tech University

586 works45,773 citationsh-index: 91

Recent Research

High-density inclined polar skyrmions with giant piezoelectricity

Yujia Wang,Xiangwei Guo,et al.

20250 citations

Semiconductor materials and interfaces

Advancements in Semiconductor Devices and Circuit Design

Thin-Film Transistor Technologies

Advanced Surface Polishing Techniques

Copper Interconnects and Reliability

Silicon Nanostructures and Photoluminescence

3D IC and TSV technologies

Laser Material Processing Techniques

Advancements in Photolithography Techniques

Yuanjing Cui Beijing Institute of Petrochemical Technology

336 works30,932 citationsh-index: 73

Roel van Driel University Vocational Awards Council

211 works13,959 citationsh-index: 66

Dongsheng Li Shenyang Ligong University

456 works7,541 citationsh-index: 40

Zhiyu Wang Hebei Medical University

203 works7,347 citationsh-index: 41

Joost Snijder Utrecht University

129 works7,175 citationsh-index: 41

Moiré Engineering of Interlayer Coupling in WS<sub>2</sub>/MoS<sub>2</sub> Monolayers

Linglong Zhang,Muhammad Shahid Rafique,et al.

20252 citations

Enhanced Emission in Erbium- and Ytterbium-Doped Gallium Oxide Devices with Constrained Energy Band on Silicon Substrates

Houwei Pang,Lei Yang,et al.

20252 citations

Intensive and Persistent Chemiluminescence from Orderly Arranged Ligands within Metal–Organic Frameworks for Inflammation Imaging

Hongxu Chen,Wenqian Cao,et al.

20254 citations

Lanthanide-Doped Nanoparticles Anchoring on Metal–Organic Frameworks with Thermally Enhanced Upconversion Luminescence for Sensitive Nanothermometers

Wenqian Cao,Zhengluan Liao,et al.

20249 citations

E-Test Validation of Space Error Budget and Metrology

Guillaume Schelcher,E. P. De Poortere,et al.

20221 citations