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Advantest (Japan) | Researchclopedia

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Advantest (Japan)

Tokyocompany

598

Works

9,425

Citations

42

h-index

Top Research Topics

VLSI and Analog Circuit Testing Advancements in PLL and VCO Technologies Integrated Circuits and Semiconductor Failure Analysis

Top Researchers

Kazuhiro Yamamoto California Institute of Technology

683 works25,779 citationsh-index: 74

Recent Research

Velocity Profile Generation for Industrial Robots Considering Natural Frequency Variations

Shingo Tajima,Kazuya Miyashita,et al.

20260 citations

Advancements in Photolithography Techniques

Photonic and Optical Devices

Analog and Mixed-Signal Circuit Design

Semiconductor Lasers and Optical Devices

Semiconductor materials and devices

Electron and X-Ray Spectroscopy Techniques

Advanced Electrical Measurement Techniques

Radio Frequency Integrated Circuit Design

Terahertz technology and applications

Takashi Yamashita Tokyo University of Technology

1,164 works19,725 citationsh-index: 56

Koji Hasegawa Kyoto Medical Center

1,020 works18,580 citationsh-index: 70

671 works17,980 citationsh-index: 64

Keisuke Ito Albert Einstein College of Medicine

456 works17,830 citationsh-index: 57

Masao Watanabe Iwate University

584 works17,823 citationsh-index: 68

A mm-Wave Frontend Circuit with High Accuracy Power Levels for ATE to Test 76- to 81- GHz Radar IC

Norio Kobayashi,Minoru Iida,et al.

20250 citations

A novel EPE measurement method for curvilinear pattern with Multigon format

Ryuichi Onodera,Hiroyuki Takahashi,et al.

20250 citations

High-NA EUV mask CD-SEM metrology matching, and contour-based comparison of simulation result and wafer print

Joost Bekaert,Jirka Schatz,et al.

20250 citations

Challenges and Opportunities of Detachable Metallic Interconnects Fiber-to-Chip Connectors for Co-Packaged Optics in High-Volume Production

Heng Loong Lee,Andrew Meek,et al.

20250 citations

Design of a DUT Socket for OTA Testing with Automated Test Equipment

Kewei Qin,Eric Sun,et al.

20250 citations