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STMicroelectronics (Czechia) | Researchclopedia

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STMicroelectronics (Czechia)

Praguecompany

1,889

Works

28,577

Citations

66

h-index

Top Research Topics

Semiconductor materials and devices Advancements in Semiconductor Devices and Circuit Design Integrated Circuits and Semiconductor Failure Analysis

Top Researchers

M. Casarsa University of Trieste

2,146 works99,633 citationsh-index: 133

Recent Research

Towards a unified control plan - a method for integrating and evaluating automated control plans in manufacturing systems

Allwell Dilosi,Alaa Hassan,et al.

20260 citations

Silicon Carbide Semiconductor Technologies

Silicon and Solar Cell Technologies

Radio Frequency Integrated Circuit Design

Semiconductor materials and interfaces

Copper Interconnects and Reliability

3D IC and TSV technologies

Photonic and Optical Devices

Embedded Systems Design Techniques

Thin-Film Transistor Technologies

F. Bedeschi Istituto Nazionale di Fisica Nucleare, Sezione di Pisa

2,107 works77,903 citationsh-index: 125

Qing Liu Eastern Institute of Technology

3,215 works62,088 citationsh-index: 106

R. Castello University of Pavia

763 works56,587 citationsh-index: 106

É. Chapon Commissariat à l'Énergie Atomique et aux Énergies Alternatives

1,446 works52,234 citationsh-index: 102

C. Julien Centre National de la Recherche Scientifique

830 works28,802 citationsh-index: 92

Investigation of Defect Propagation in 4H-SiC: From Substrate to Epitaxial Layers

Francesco Maria Fiorino,F. Ruffino,et al.

20260 citations

In Situ vs. Ex Situ Indentation for Adhesion Evaluation of Nitride/Polymer Interfaces: A Comparative Study Under Controlled Ambient Conditions

Filippo Sabatini,Emanuele Cattarinuzzi,et al.

20260 citations

Design and Performance of Two‐Sided Self‐Protecting Perovskite Solar Cells for Indoor Vertical Applications

Salvatore Valastro,Sebastian Ferranti,et al.

20260 citations

Multiscale modeling of gallium nitride atomic layer etching in chlorinated plasmas: A combined dynamic global model, <i>ab initio</i> , and kinetic Monte Carlo approach

Tojo Rasoanarivo,C. Mannequin,et al.

20260 citations

Investigating composition-dependent fracture toughness in silicon-rich silicon nitride layers

Filippo Sabatini,Emanuele Cattarinuzzi,et al.

20260 citations