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Onto Innovation (United States) | Researchclopedia

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Onto Innovation (United States)

Wilmington, North Carolinacompany

96

Works

1,954

Citations

21

h-index

Top Research Topics

Optical Coatings and Gratings Advancements in Photolithography Techniques Integrated Circuits and Semiconductor Failure Analysis

Top Researchers

David L. Streiner McMaster University

847 works62,890 citationsh-index: 109

Recent Research

Reverse Osmosis Pressure Vessel with Bypass Flows: Optimized Flow Rate and Location for Reduced Energy Consumption

Sangsuk Lee,Amit Y. Sankhe,et al.

20260 citations

3D IC and TSV technologies

Semiconductor materials and devices

Ultrasonics and Acoustic Wave Propagation

Industrial Vision Systems and Defect Detection

Surface Roughness and Optical Measurements

Electronic Packaging and Soldering Technologies

Advanced Surface Polishing Techniques

Thin-Film Transistor Technologies

Ruminant Nutrition and Digestive Physiology

Victor C. Li University of Michigan

716 works47,598 citationsh-index: 123

Y. S. Lin Kunming University of Science and Technology

825 works26,029 citationsh-index: 87

195 works21,175 citationsh-index: 56

Zhuo Chen Beijing Institute of Technology

868 works20,334 citationsh-index: 63

Margaret I. Fitch University of Toronto

564 works13,402 citationsh-index: 60

Mid-infrared ellipsometry for optical critical dimension metrology

G. Andrew Antonelli,Troy. D. Ribaudo,et al.

20260 citations

Frequency stabilization and referencing of a mid-infrared dual-comb spectrometer

Chu C. Teng,Yifeng Chen,et al.

20260 citations

Satellite Selection for In-Band Coexistence of Dense LEO Networks

Eunsun Kim,Ian P. Roberts,et al.

20261 citations

Non-destructive lateral cavity etch measurements of 8-superlattice layer nanowire test structures using optical Mueller matrix spectroscopic ellipsometry, x-ray diffraction, and x-ray fluorescence

Ezra Mel B. Pasikatan,G. A. Antonelli,et al.

20250 citations

Early Zone Correction for Enhanced Overlay Precision in Next-Generation FOPLP Lithography

John Chang,Jian Lü,et al.

20250 citations