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Built-in test for VLSI: Pseudorandom techniques

1989862 citationsJournal Article

Authors

Topics & Keywords

VLSI and Analog Circuit Testing Integrated Circuits and Semiconductor Failure Analysis Electrostatic Discharge in Electronics

Publication Details

Published in: Integration

Volume 7, Issue 3, pp. 327-327

DOI: 10.1016/0167-9260(89)90009-6

Field-Weighted Citation Impact: 19.20

Built-in test for VLSI: Pseudorandom techniques | Researchclopedia