Ionizing radiation effects in MOS devices and circuits

19891,219 citationsBook

Authors

P. V. Dressendorfer · Sandia National Laboratories California

Abstract

Historical Perspective (H. Hughes). Electron--Hole Generation, Transport, and Trapping in SiO2 (F. McLean, et al.). Radiation--Induced Interface Traps (P. Winokur). Radiation Effects on MOS Devices and Circuits (P. Dressendorfer). Radiation--Hardening Technology (P. Dressendorfer). Process--Induced Radiation Effects (T. Ma). Source Considerations and Testing Techniques (K. Kerris). Transient--Ionization and Single--Event Phenomena (S. Kerns). Index.

Topics & Keywords

Radiation Effects in Electronics Semiconductor materials and devices Integrated Circuits and Semiconductor Failure Analysis

Publication Details

Published in: Medical Entomology and Zoology

Field-Weighted Citation Impact: 24.64

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Ionizing radiation effects in MOS devices and circuits

Authors

Abstract

Topics & Keywords

Publication Details