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Advanced Scanning Electron Microscopy and X-Ray Microanalysis

1986404 citationsBook

Authors

Dale E. Newbury · National Institute of Standards and Technology

David C. Joy · AT&T (United States)

Patrick Echlin · University of Cambridge

Charles E. Fiori · National Institutes of Health

Joseph I. Goldstein · Lehigh University

Topics & Keywords

Electron and X-Ray Spectroscopy Techniques Advanced Materials Characterization Techniques

Publication Details

DOI: 10.1007/978-1-4757-9027-6

Field-Weighted Citation Impact: 2.95

Advanced Scanning Electron Microscopy and X-Ray Microanalysis | Researchclopedia