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ESD in silicon integrated circuits

1996442 citationsJournal Article

Authors

Topics & Keywords

Electrostatic Discharge in Electronics Integrated Circuits and Semiconductor Failure Analysis Physical Unclonable Functions (PUFs) and Hardware Security

Publication Details

Published in: Microelectronics Reliability

Volume 36, Issue 4, pp. 563-563

DOI: 10.1016/s0026-2714(96)90047-5

Field-Weighted Citation Impact: 15.86

ESD in silicon integrated circuits | Researchclopedia