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Separating Reliability and Stability in Test-Retest Correlation

1969590 citationsJournal Article

Authors

David R. Heise · University of Wisconsin System

Topics & Keywords

VLSI and Analog Circuit Testing Engineering and Test Systems Software Reliability and Analysis Research

Publication Details

Published in: American Sociological Review

Volume 34, Issue 1, pp. 93-93

DOI: 10.2307/2092790

Field-Weighted Citation Impact: 10.54

Separating Reliability and Stability in Test-Retest Correlation | Researchclopedia