IBM experiments in soft fails in computer electronics (1978–1994)

1996451 citationsJournal Article

Authors

J. F. Ziegler · IBM Research - Thomas J. Watson Research Center

H. W. Curtis · IBM Research - Thomas J. Watson Research Center

H. P. Muhlfeld · IBM (United States)

C. J. Montrose · IBM (United States)

Bernard Chin · IBM (United States)

M. Nicewicz · IBM (United States)

Chad Russell

Abstract

This historical review covers IBM experiments in evaluating radiation-induced soft fails in LSI electronics over a fifteen-year period, concentrating on major scientific and technical advances which have not been previously published.

Topics & Keywords

Radiation Effects in Electronics VLSI and Analog Circuit Testing Integrated Circuits and Semiconductor Failure Analysis

Publication Details

Published in: IBM Journal of Research and Development

Volume 40, Issue 1, pp. 3-18

DOI: 10.1147/rd.401.0003

Field-Weighted Citation Impact: 8.76

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IBM experiments in soft fails in computer electronics (1978–1994)

Authors

Abstract

Topics & Keywords

Publication Details