Pulsed force mode: a new method for the investigation of surface properties

Scanning force microscopy is extended by the pulsed force mode from simple imaging of topography to measuring elastic, electrostatic and adhesive sample properties. Lateral forces are virtually eliminated so that mapping of delicate samples with high resolution in air and fluids is easily possible. Scanning speed is comparable to that in contact mode. The new opportunities for scanning force microscopy given by the pulsed force mode is demonstrated in selected applications. Copyright © 1999 John Wiley & Sons, Ltd.