Voltages before and after HBM stress and their effect on dynamically triggered power supply clamps

200432 citationsJournal Article

Authors

R.A. Ashton · South Mountain Community College

Tom Meuse · Electron Optica (United States)

Abstract

HBM and TLP measurements on dynamically triggered CMOS power supply clamps were found to be inconsistent for low leakage clamps. The failures at low HBM voltage were found to be due to a voltage ramp leading up to the HBM pulse which prevented the clamps from turning on.

Topics & Keywords

Electrostatic Discharge in Electronics Electromagnetic Compatibility and Noise Suppression Low-power high-performance VLSI design

UN Sustainable Development Goals

Affordable and clean energy

Publication Details

DOI: 10.1109/eosesd.2004.5272616

Field-Weighted Citation Impact: 2.30