Single-shot measurement of a terahertz electric-field waveform using a reflective echelon mirror

Single-shot measurements of terahertz (THz) electric-field waveforms are demonstrated using a reflective echelon mirror, which produces multiple probe pulses with different time-delays. The polarization rotation of the probe pulses, due to the electro-optic effect induced by the THz electric field generated from grating-coupled LiNbO3, was imaged onto a two-dimensional complementary metal-oxide-semiconductor camera. A waveform with a weak peak field strength of 0.6 kV/cm was obtained with a good signal-to-noise ratio, demonstrating precise single-shot detection of the THz electric field waveform.