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Failure and reliability analysis of STT-MRAM

2012246 citationsJournal Article

Authors

Weisheng Zhao · Université Paris-Sud

Yin Zhang · Université Paris-Sud

T. Devolder · Centre National de la Recherche Scientifique

Jacques‐Olivier Klein · Université Paris-Sud

D. Ravelosona · Centre National de la Recherche Scientifique

C. Chappert · Centre National de la Recherche Scientifique

Topics & Keywords

Magnetic properties of thin films Magnetic Properties and Applications Ferroelectric and Negative Capacitance Devices

Publication Details

Published in: Microelectronics Reliability

Volume 52, Issue 9-10, pp. 1848-1852

DOI: 10.1016/j.microrel.2012.06.035

Field-Weighted Citation Impact: 10.75

Failure and reliability analysis of STT-MRAM | Researchclopedia

· STMicroelectronics (France)