Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

199832 citationsJournal Articlebronze Open Access

Authors

Tony Warwick · University of California, Berkeley

Harald Ade · North Carolina State University

S. Cerasari · University of California, Berkeley

Jonathan D. Denlinger · University of Michigan–Ann Arbor

Keith D. Franck · University of California, Berkeley

Adrian Garcia · University of California, Berkeley

Shinjiro Hayakawa

Abstract

The development of two zone-plate microscopes for X-ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.

Topics & Keywords

Electron and X-Ray Spectroscopy Techniques X-ray Spectroscopy and Fluorescence Analysis Advanced X-ray Imaging Techniques

Publication Details

Published in: Journal of Synchrotron Radiation

Volume 5, Issue 3, pp. 1090-1092

DOI: 10.1107/s0909049597014283

Field-Weighted Citation Impact: 3.39

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Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

Authors

Abstract

Topics & Keywords

Publication Details