An alternative version of X-ray fluorescence analysis

Publications on a version of X-ray fluorescence analysis (XFA) based on new principles are considered. Limitations on the sample sizes, shapes, and the quality of surfaces are excluded. The sample preparation of emitters is performed on polishing papers. The thin layers of materials are analyzed. The ratio between the spectral line intensities of the pairs of components is an analytical signal. A formula and a procedure for calculating the composition from the measured intensity ratios and the relative intensity coefficients of the pairs of components, which are independent of the sample composition, are given. The dependence of spectral line intensities on the atomic rather than weight concentrations of components is shown. The developed version of XFA excludes the need for the knowledge of a primary spectrum and the application of corrections for matrix effects. The examples of the analyses of multicomponent nonferrous alloys, steels, and powders are considered. The analytical characteristics of standard XFA and alternative XFA (AXFA) are compared.