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Tunneling spectroscopy of the Si(111)2 × 1 surface

1987615 citationsJournal Article

Authors

R. M. Feenstra · IBM (United States)

Joseph A. Stroscio · IBM (United States)

A. P. Fein · IBM (United States)

Topics & Keywords

Surface and Thin Film Phenomena Force Microscopy Techniques and Applications Advanced Materials Characterization Techniques

Publication Details

Published in: Surface Science

Volume 181, Issue 1-2, pp. 295-306

DOI: 10.1016/0039-6028(87)90170-1

Field-Weighted Citation Impact: 16.77

Tunneling spectroscopy of the Si(111)2 × 1 surface | Researchclopedia