A phase retrieval algorithm for shifting illumination

2004930 citationsJournal Article

Authors

J. M. Rodenburg · University of Sheffield

H. M. L. Faulkner · University of Sheffield

Abstract

We propose a method of iterative phase retrieval that uses measured intensities in the diffraction plane to solve the phase problem in a way that bypasses the problem of lens aberration, leading to greatly improved spatial resolution. This method is stable, easy to implement experimentally, and can be used to view a large area of the specimen when that is desired.

Topics & Keywords

Advanced X-ray Imaging Techniques Advanced Electron Microscopy Techniques and Applications X-ray Spectroscopy and Fluorescence Analysis

Publication Details

Published in: Applied Physics Letters

Volume 85, Issue 20, pp. 4795-4797

DOI: 10.1063/1.1823034

Field-Weighted Citation Impact: 2.11

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A phase retrieval algorithm for shifting illumination

Authors

Abstract

Topics & Keywords

Publication Details