Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability

1980362 citationsJournal Article

Authors

Crouzet · Laboratoire d'Analyse et d'Architecture des Systèmes

Abstract

At the end of an IC production line, integrated circuits are generally submitted to three kinds of tests: 1) parametric tests to check electrical characteristics (voltage, current, power consumption), 2) dynamic tests to check response times under nominal operating conditions, and 3) functional tests to check its logical behavior.

Topics & Keywords

VLSI and Analog Circuit Testing Integrated Circuits and Semiconductor Failure Analysis Physical Unclonable Functions (PUFs) and Hardware Security

UN Sustainable Development Goals

Affordable and clean energy

Publication Details

Published in: IEEE Transactions on Computers

Volume C-29, Issue 6, pp. 527-531

DOI: 10.1109/tc.1980.1675614

Field-Weighted Citation Impact: 18.66