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Characterization and modeling of electrical stress degradation in STI-based integrated power devices
2014
39 citations
Journal Article
Field-Weighted Citation Impact:
2.13
Characterization and modeling of electrical stress degradation in STI-based integrated power devices | Researchclopedia
Ming-Yeh Chuang
·
Texas Instruments (United States)
Weidong Tian
·
Texas Instruments (United States)
S. Pendharkar
·
Texas Instruments (United States)
M. Denison
·
Texas Instruments (United States)