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Structural and XPS characterization of ALD Al2O3 coated porous silicon

2014327 citationsJournal Article

Authors

Igor Iatsunskyi · Odesa I. I. Mechnikov National University

Mateusz Kempiǹski · Adam Mickiewicz University in Poznań

Mariusz Jancelewicz · Adam Mickiewicz University in Poznań

Karol Załęski · Adam Mickiewicz University in Poznań

Stefan Jurga · Adam Mickiewicz University in Poznań

В. А. Смынтына · Odesa I. I. Mechnikov National University

Topics & Keywords

Semiconductor materials and devices Silicon Nanostructures and Photoluminescence Semiconductor materials and interfaces

UN Sustainable Development Goals

Affordable and clean energy

Publication Details

Published in: Vacuum

Volume 113, pp. 52-58

DOI: 10.1016/j.vacuum.2014.12.015

Field-Weighted Citation Impact: 8.54

Structural and XPS characterization of ALD Al2O3 coated porous silicon | Researchclopedia