Work function of indium tin oxide transparent conductor measured by photoelectron spectroscopy

1996678 citationsJournal Article

Authors

Yongsup Park · University of Rochester

V.‐E. Choong · University of Rochester

Yongli Gao · University of Rochester

B. R. Hsieh · Palo Alto Research Center

Chak Wah Tang · Kodak (United States)

Abstract

We used ultraviolet and x-ray photoelectron spectroscopy (XPS) and (UPS) techniques to directly measure absolute values of vacuum work function of indium tin oxide (ITO) thin films. We obtained a work function of 4.4–4.5 eV which is lower than the commonly cited value. These values do not change substantially by heating and Ar ion sputtering. The atomic concentrations of each element in ITO, measured with XPS, are also quite stable under heat treatment and ion sputtering.

Topics & Keywords

Surface and Thin Film Phenomena Transition Metal Oxide Nanomaterials Electron and X-Ray Spectroscopy Techniques

UN Sustainable Development Goals

Affordable and clean energy

Publication Details

Published in: Applied Physics Letters

Volume 68, Issue 19, pp. 2699-2701

DOI: 10.1063/1.116313

Field-Weighted Citation Impact: 4.43