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Risks of damage to electronics with reference to charged clothing

20059 citationsJournal Article

Authors

Jaakko Paasi · VTT Technical Research Centre of Finland

Tapio Kalliohaka · VTT Technical Research Centre of Finland

Jeremy Smallwood

Arne Börjesson

Jürgen Haase · Sächsisches Textilforschungsinstitut

Christian Vogel · Sächsisches Textilforschungsinstitut

Philippe Lemaire · Centexbel

Topics & Keywords

Electrostatic Discharge in Electronics Electrical Fault Detection and Protection Electromagnetic Compatibility and Noise Suppression

Publication Details

Published in: Journal of Electrostatics

Volume 63, Issue 6-10, pp. 603-608

DOI: 10.1016/j.elstat.2005.03.023

Field-Weighted Citation Impact: 0.72

Risks of damage to electronics with reference to charged clothing | Researchclopedia

G. Coletti · University of Genoa

F. Guastavino · University of Genoa

Terttu Peltoniemi · Nokia (Finland)