Trends and challenges in VLSI circuit reliability

2003612 citationsJournal Article

Authors

Cris S. Constantinescu · Laboratory for Research on Enterprise and Decisions

Abstract

Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them.

Topics & Keywords

Integrated Circuits and Semiconductor Failure Analysis Radiation Effects in Electronics VLSI and Analog Circuit Testing

Publication Details

Published in: IEEE Micro

Volume 23, Issue 4, pp. 14-19

DOI: 10.1109/mm.2003.1225959

Field-Weighted Citation Impact: 17.41

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Trends and challenges in VLSI circuit reliability

Authors

Abstract

Topics & Keywords

Publication Details