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Gate dielectric formation and MIS interface characterization on Ge
2007
105 citations
Journal Article
Field-Weighted Citation Impact:
10.71
Gate dielectric formation and MIS interface characterization on Ge | Researchclopedia
Y. Yamashita
·
Mirai Hospital
Mitsuru Nishikawa
·
The University of Tokyo
Hidenori Kumagai
·
The University of Tokyo
Ryosho Nakane
·
The University of Tokyo
Satoshi Sugahara
·
Tokyo Institute of Technology
Naoharu Sugiyama
·
Mirai Hospital