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Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes | Researchclopedia
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Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes
2002
16 citations
Journal Article
Field-Weighted Citation Impact:
1.37
Joanneum Research
M. Schatzmayr
·
Joanneum Research
Christoph Mitterbauer
·
Graz University of Technology
Ferdinand Hofer
·
Austrian Centre for Electron Microscopy and Nanoanalysis
G. Leising
·
Joanneum Research