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The Test Access Port and Boundary-Scan Architecture

1990802 citationsBookgold Open Access

Authors

Rodham E. Tulloss

Topics & Keywords

VLSI and Analog Circuit Testing Integrated Circuits and Semiconductor Failure Analysis Engineering and Test Systems

UN Sustainable Development Goals

Sustainable cities and communities

Publication Details

DOI: 10.13140/rg.2.1.2013.9606

Field-Weighted Citation Impact: 12.04

The Test Access Port and Boundary-Scan Architecture | Researchclopedia