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Conditions and reasons for incoherent imaging in STEM

1996397 citationsJournal Article

Authors

Peter Hartel · Institut für Technische und Angewandte Physik (Germany)

H. Rose · Institut für Technische und Angewandte Physik (Germany)

C. Dinges · Institut für Technische und Angewandte Physik (Germany)

Topics & Keywords

Advanced Electron Microscopy Techniques and Applications Crystallography and Radiation Phenomena Advanced X-ray Imaging Techniques

Publication Details

Published in: Ultramicroscopy

Volume 63, Issue 2, pp. 93-114

DOI: 10.1016/0304-3991(96)00020-4

Field-Weighted Citation Impact: 12.66

Conditions and reasons for incoherent imaging in STEM | Researchclopedia