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Testing of manufacturing faults of CMS RPC link boards

20090 citationsJournal Article

Authors

A. Korpela · Lappeenranta-Lahti University of Technology

A. Karjalainen · Lappeenranta-Lahti University of Technology

T. Tuuva · Lappeenranta-Lahti University of Technology

Topics & Keywords

Integrated Circuits and Semiconductor Failure Analysis VLSI and Analog Circuit Testing Particle Detector Development and Performance

UN Sustainable Development Goals

Industry, innovation and infrastructure

Publication Details

Published in: Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment

Volume 617, Issue 1-3, pp. 287-288

DOI: 10.1016/j.nima.2009.06.078

Field-Weighted Citation Impact: 0.00

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