Contact resistance: Its measurement and relative importance to power loss in a solar cell

The concept of contact resistivity is discussed briefly and a technique for its measurement is presented. This technique allows for resistive contact material and for the possibility that the semiconductor sheet resistance beneath the contact differs from the semiconductor sheet resistance beside the contact. The test pattern is unique in that the effects of contact resistance are accumulated over the pattern, nearly unencumbered by voltage and current probes which might otherwise influence the current flow. Measurements of contact resistivities for typical solar cell metallizations using this technique are reported to be in the mid 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-6</sup> Ω-cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> range. The relative importance of contact resistance compared to other sources of power loss in a solar cell is determined for a typical contact system. Expressions derived in order to make this comparison are useful for evaluating and optimizing a solar cell contact system. Values of series resistance calculated using these expressions are compared with measured values.