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Concentration profiles in paint layers studied by differential PIXE

200823 citationsJournal Article

Authors

Ž. Šmit · Jožef Stefan Institute

Mitja Uršič · Jožef Stefan Institute

Primož Pelicon · Jožef Stefan Institute

T. Trček-Pečak · University of Ljubljana

Blaž Šeme · University of Ljubljana

A. Smrekar · National Gallery of Art

Topics & Keywords

X-ray Spectroscopy and Fluorescence Analysis Electron and X-Ray Spectroscopy Techniques Nuclear Physics and Applications

Publication Details

Published in: Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

Volume 266, Issue 9, pp. 2047-2059

DOI: 10.1016/j.nimb.2008.03.191

Field-Weighted Citation Impact: 3.12

Concentration profiles in paint layers studied by differential PIXE | Researchclopedia

Slovenian Museum of Natural History

Ivan Němec · Institute for the Protection of Cultural Heritage of Slovenia

Katja Kavkler · Institute for the Protection of Cultural Heritage of Slovenia