Researchclopedia

Research Researchers Institutions Topics Submit About

Command Palette

Search for a command to run...

Researchclopedia

Research Researchers Institutions About

© 2026 Researchclopedia. Powered by OpenAlex under CC0 license.

Back to research

NBTI degradation: From physical mechanisms to modelling

2005499 citationsJournal Article

Authors

V. Huard · Philips (France)

M. Denais · STMicroelectronics (France)

C. Parthasarathy · STMicroelectronics (France)

Topics & Keywords

Semiconductor materials and devices Advancements in Semiconductor Devices and Circuit Design Integrated Circuits and Semiconductor Failure Analysis

Publication Details

Published in: Microelectronics Reliability

Volume 46, Issue 1, pp. 1-23

DOI: 10.1016/j.microrel.2005.02.001

Field-Weighted Citation Impact: 29.02

NBTI degradation: From physical mechanisms to modelling | Researchclopedia