The Application of Inductively Coupled Plasma Atomic Emission Spectrometry and a Sequential Spectrometer for Thallium Determination in Cadmium Anodes

19871 citationsJournal Article

Authors

I. B. Brenner · Geological Survey of Israel

J. R. Goldstein · Geological Survey of Israel

H. Bezalel · Geological Survey of Israel

Abstract

Inductively coupled plasma atomic emission spectrometry is increasingly relied upon for the analysis and characterization of metallurgical and related materials, from the raw material to the finished product. However, descriptions of the analysis of metal products related to the electronics industry are scant.

Topics & Keywords

Analytical chemistry methods development Ion-surface interactions and analysis Advanced Materials Characterization Techniques

UN Sustainable Development Goals

Industry, innovation and infrastructure

Publication Details

Published in: Applied Spectroscopy

Volume 41, Issue 2, pp. 312-313

DOI: 10.1366/000370287774986796

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