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Computed tomography for dimensional metrology

2011667 citationsJournal Article

Authors

Jean‐Pierre Kruth · KU Leuven

Markus Bartscher · Physikalisch-Technische Bundesanstalt

Simone Carmignato · University of Padua

Robert Schmitt · RWTH Aachen University

Leonardo De Chiffre · Technical University of Denmark

Albert Weckenmann · Friedrich-Alexander-Universität Erlangen-Nürnberg

Topics & Keywords

Advanced X-ray and CT Imaging Medical Imaging Techniques and Applications Advanced Measurement and Metrology Techniques

Publication Details

Published in: CIRP Annals

Volume 60, Issue 2, pp. 821-842

DOI: 10.1016/j.cirp.2011.05.006

Field-Weighted Citation Impact: 19.22

Computed tomography for dimensional metrology | Researchclopedia