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Metrological evaluation of Microsoft Kinect and Asus Xtion sensors

2013148 citationsJournal Article

Authors

H. González-Jorge · Universidade de Vigo

B. Riveiro · Universidade de Vigo

Esteban Vázquez-Fernández · Centro Tecnolóxico de Telecomunicacións de Galicia

Joaquín Martínez-Sánchez · Universidade de Vigo

Pedro Arias · Universidade de Vigo

Topics & Keywords

Optical measurement and interference techniques Advanced Measurement and Metrology Techniques Advanced Optical Sensing Technologies

Publication Details

Published in: Measurement

Volume 46, Issue 6, pp. 1800-1806

DOI: 10.1016/j.measurement.2013.01.011

Field-Weighted Citation Impact: 21.52

Metrological evaluation of Microsoft Kinect and Asus Xtion sensors | Researchclopedia