Tests of a prototype pixel array detector for microsecond time-resolved X-ray diffraction

X-ray test results from a prototype 92 × 100 pixel array detector (PAD) for use in rapid time-resolved X-ray diffraction studies are described. This integrating detector is capable of taking up to eight full-frame images at microsecond frame times. It consists of a silicon layer, which absorbs the X-rays, bump-bonded to a layer of CMOS electronics in which each pixel has its own processing, storage and readout electronics. Tests indicate signal performance characteristics are comparable with phosphor-based CCD X-ray detectors, with greatly improved time resolution, comparable linearity and enhanced point spread. This prototype is a test module en route to a larger detector suitable for dedicated operation. Areas of needed improvement are discussed.