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A field ion microscope study of atomic configuration at grain boundaries

1964541 citationsJournal Article

Authors

D. G. Brandon · University of Cambridge

Ralph B. D’Agostino · University of Cambridge

Sarath Ranganathan · University of Cambridge

M. Wald · Israel Atomic Energy Commission

Topics & Keywords

Advanced Materials Characterization Techniques Force Microscopy Techniques and Applications Surface and Thin Film Phenomena

Publication Details

Published in: Acta Metallurgica

Volume 12, Issue 7, pp. 813-821

DOI: 10.1016/0001-6160(64)90175-0

Field-Weighted Citation Impact: 15.49

A field ion microscope study of atomic configuration at grain boundaries | Researchclopedia