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Beam-loss-induced electrical stress test on CMS Silicon Strip Modules

200312 citationsJournal Article

Authors

M. Fahrer · Karlsruhe Institute of Technology

G. Dirkes · Karlsruhe Institute of Technology

F. Hartmann · Karlsruhe Institute of Technology

S. Heier · Karlsruhe Institute of Technology

A. Macpherson · European Organization for Nuclear Research

Th. Müller · Karlsruhe Institute of Technology

Topics & Keywords

Particle Detector Development and Performance Electrostatic Discharge in Electronics Radiation Effects in Electronics

UN Sustainable Development Goals

Affordable and clean energy

Publication Details

Published in: Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment

Volume 518, Issue 1-2, pp. 328-330

DOI: 10.1016/j.nima.2003.11.011

Field-Weighted Citation Impact: 2.25

Beam-loss-induced electrical stress test on CMS Silicon Strip Modules | Researchclopedia

· Karlsruhe Institute of Technology