Investigation of the shift of Raman modes of graphene flakes

200725 citationsJournal Article

Authors

M. Haluška · Eindhoven University of Technology

Dirk Obergfell · Max Planck Institute for Solid State Research

Jannik C. Meyer · University of California, Berkeley

Giusy Scalia · Max Planck Institute for Solid State Research

Gerhard Ulbricht · Max Planck Institute for Solid State Research

B. Krauss · Max Planck Institute for Solid State Research

Dong-Hun Chae

Abstract

Abstract In the present work, we use Raman spectroscopy as sensitive tool for the characterization of graphene samples. We observed diverse shifts in the position of the Raman mode close to 2650 cm –1 in various as‐prepared graphene flakes. In order to elucidate the reason for this variation, we checked different substrates (Si/SiO 2 and Si/Al 2 O 3 ) and the effect of the annealing of graphene in argon. We find that most of as‐prepared graphene flakes were non‐intentional doped by holes, i.e. by physisorbed water and/or oxygen. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

Topics & Keywords

Graphene research and applications Diamond and Carbon-based Materials Research Carbon Nanotubes in Composites

UN Sustainable Development Goals

Clean water and sanitation

Publication Details

Published in: physica status solidi (b)

Volume 244, Issue 11, pp. 4143-4146

DOI: 10.1002/pssb.200776202

Field-Weighted Citation Impact: 1.44