Time domain reflection methods for dielectric measurements to 10 GHz

Total reflection methods and instrumentation for their use are described for measurements of dielectric permittivity and loss at frequencies to 10 GHz or more. Several cell designs are shown, together with analyses of their performance. Procedures are given for correcting effects of wave propagation in the cells and residual reflections in the cells by bilinear analysis with calibrations using dielectrics of known permittivity. Representative results are presented for highly polar liquids, dilute solutions of polar molecules in nonpolar solvents, electrolyte solutions, and ionic glasses with appreciable ohmic conduction.