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Wavelets and their applications for surface metrology

200873 citationsJournal Article

Authors

Xiangqian Jiang · University of Huddersfield

Paul J. Scott · University of Huddersfield

David J. Whitehouse · University of Huddersfield

Topics & Keywords

Surface Roughness and Optical Measurements Laser Material Processing Techniques Advanced Measurement and Metrology Techniques

Publication Details

Published in: CIRP Annals

Volume 57, Issue 1, pp. 555-558

DOI: 10.1016/j.cirp.2008.03.110

Field-Weighted Citation Impact: 2.30

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