Formation of electron internal transport barriers by highly localized electron cyclotron resonance heating in the large helical device

Internal transport barriers with respect to electron thermal transport (eITB) were observed in the large helical device, when the electron cyclotron resonance heating (ECH) power was highly localized on the centre of a plasma sustained by neutral beam injection. The eITB is characterized by a high central electron temperature of 6–8 keV with an extremely steep gradient, as high as 55 keV m−1 and a low electron thermal diffusivity within a normalized average radius ρ≈0.3 as well as by the existence of clear thresholds for the ECH power and plasma collisionality.