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A review of recent MOSFET threshold voltage extraction methods

2002958 citationsReviewgreen Open Access

Authors

A. Ortíz-Conde · Simón Bolívar University

Francisco J. García-Sánchez · Simón Bolívar University

J.J. Liou · University of Central Florida

A. Cerdeira · Center for Research and Advanced Studies of the National Polytechnic Institute

M. Estrada · Center for Research and Advanced Studies of the National Polytechnic Institute

Y. Yue · Intersil (United States)

Topics & Keywords

Semiconductor materials and devices Advancements in Semiconductor Devices and Circuit Design Silicon Carbide Semiconductor Technologies

UN Sustainable Development Goals

Affordable and clean energy

Publication Details

Published in: Microelectronics Reliability

Volume 42, Issue 4-5, pp. 583-596

DOI: 10.1016/s0026-2714(02)00027-6

Field-Weighted Citation Impact: 3.43

A review of recent MOSFET threshold voltage extraction methods | Researchclopedia