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A Board-Level Prognostic Monitor for MOSFET TDDB

200628 citationsJournal Article

Authors

D. Goodman · Ridgetop Group (United States)

Bert Vermeire · Ridgetop Group (United States)

Jeremy Ralston-Good · Ridgetop Group (United States)

R.J. Graves · Ridgetop Group (United States)

Abstract

A prognostic cell to monitor time-dependent dielectric breakdown and electronic aging of integrated circuits has been designed and fabricated.

Topics & Keywords

Semiconductor materials and devices Integrated Circuits and Semiconductor Failure Analysis Advancements in Semiconductor Devices and Circuit Design

UN Sustainable Development Goals

Affordable and clean energy

Publication Details

Volume 1, pp. 1-6

DOI: 10.1109/aero.2006.1656127

Field-Weighted Citation Impact: 3.01

A Board-Level Prognostic Monitor for MOSFET TDDB | Researchclopedia