SEU-hardened storage cell validation using a pulsed laser

199648 citationsJournal Article

Authors

R. Velazco · Institut de Recherche Interdisciplinaire de Grenoble

T. Calin · Techniques of Informatics and Microelectronics for Integrated Systems Architecture

M. Nicolaidis · Techniques of Informatics and Microelectronics for Integrated Systems Architecture

Steven C. Moss · The Aerospace Corporation

S. D. LaLumondiere · The Aerospace Corporation

V. Tran · The Aerospace Corporation

Abstract

Laser tests performed on a prototype chip to validate new SEU-hardened storage cell designs revealed unexpected latch-up and single-event upset phenomena. The investigations that identified their location show the existence of a topology-dependent dual node upset mechanism. Design solutions are suggested to avoid its occurrence.

Topics & Keywords

Radiation Effects in Electronics Integrated Circuits and Semiconductor Failure Analysis Semiconductor materials and devices

Publication Details

Published in: IEEE Transactions on Nuclear Science

Volume 43, Issue 6, pp. 2843-2848

DOI: 10.1109/23.556875

Field-Weighted Citation Impact: 2.74

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SEU-hardened storage cell validation using a pulsed laser

Authors

Abstract

Topics & Keywords

Publication Details