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Charge trapping and interface characteristics in normally-off Al2O3/GaN-MOSFETs
2011
22 citations
Journal Article
Field-Weighted Citation Impact:
1.73
Charge trapping and interface characteristics in normally-off Al2O3/GaN-MOSFETs | Researchclopedia
Uiduk University
Dae‐Hyuk Kwon
·
Kyungil University
S. Cristoloveanu
·
Institut polytechnique de Grenoble