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Realization of Ultra Fine Pitch Traces on LCP Substrates
2008
17 citations
Journal Article
Field-Weighted Citation Impact:
4.61
Realization of Ultra Fine Pitch Traces on LCP Substrates | Researchclopedia
Foster-Miller (United States)
David J. Edell
·
InnerSea Technology (United States)
J.F. Hetke
·
University of Michigan–Ann Arbor