The Relationship Between Daily Atrial Tachyarrhythmia Burden From Implantable Device Diagnostics and Stroke Risk

2009863 citationsJournal Article

Authors

Taya V. Glotzer · The Ohio State University Wexner Medical Center

Emile G. Daoud · The Ohio State University Wexner Medical Center

D. George Wyse · Libin Cardiovascular Institute of Alberta

Daniel E. Singer · Hackensack University Medical Center

Michael Ezekowitz · Hackensack University Medical Center

Christopher E. Hilker · Massachusetts General Hospital

Clayton Miller

Abstract

The TE rate was low compared with patients with traditional AF with similar risk profiles. The data suggest that TE risk is a quantitative function of AT/AF burden. AT/AF burden > or = 5.5 hours on any of 30 prior days appeared to double TE risk. Additional studies are needed to more precisely investigate the relationship between stroke risk and AT/AF burden.

Topics & Keywords

Atrial Fibrillation Management and Outcomes Cardiac Arrhythmias and Treatments Cardiac pacing and defibrillation studies

UN Sustainable Development Goals

Good health and well-being

Publication Details

Published in: Circulation Arrhythmia and Electrophysiology

Volume 2, Issue 5, pp. 474-480

DOI: 10.1161/circep.109.849638

Field-Weighted Citation Impact: 18.24