A novel application of silicon microstrip technology for energy-dispersive EXAFS studies

200011 citationsJournal Articlebronze Open Access

Authors

G. Iles · Imperial College London

A. J. Dent · Daresbury Laboratory

G.E. Derbyshire · Rutherford Appleton Laboratory

R. C. Farrow · Daresbury Laboratory

G. Hall · Imperial College London

G.W. Noyes · Rutherford Appleton Laboratory

M. Raymond ·

Abstract

A prototype X-ray detector for energy-dispersive EXAFS has been developed and tested to demonstrate the principle of using silicon microstrip detector technology for this application. Testing took place at the UK Synchrotron Radiation Source, where the absorption spectra of a 5 microm Ni foil and a 25 mM NiCl(2) solution were obtained.

Topics & Keywords

X-ray Spectroscopy and Fluorescence Analysis Electron Spin Resonance Studies Advanced MRI Techniques and Applications

UN Sustainable Development Goals

Affordable and clean energy

Publication Details

Published in: Journal of Synchrotron Radiation

Volume 7, Issue 4, pp. 221-228

DOI: 10.1107/s0909049500005240

Field-Weighted Citation Impact: 1.42